Surface Finish Probe
Renishaw's SFP2 probe can be used in bores as small as 5 mm (0.2 in) diameter and offers a surface measurement capability of 6.3 μm to 0.05 μm Ra.
Renishaw’s SFP2 probe increases the surface finish measurement ability of the REVO system, which offers a multi-sensor capability providing touch-trigger, high-speed tactile scanning and non-contact vision measurement on a single CMM. The SFP2 system consists of a probe and a range of modules and is automatically interchangeable with all other options available for REVO. SFP2 is a skidded probe with a 2 μm radius diamond stylus tip. The skid is held against the surface with a controlled force of approximately 0.2 N whilst the stylus tip force is 0.005 N. Each module has a unique geometry as well as a knuckle joint that allows the angle between the surface finish holder (SFH) and the surface finish module (SFM) to be chosen within a range of 180°, using the module setting tool (MST). Access to the most difficult to reach features is provided by an integral probe C-axis, coupled with various tip geometries and a knuckle joint between module and holder. The surface finish system is managed by the same I++ DME compliant interface as the REVO system, and full user functionality is provided by Renishaw’s MODUS metrology software.